Point defects in the semiconducting β-TeO<sub>2</sub> monolayer : Structural stability and electronic properties

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XU Luya; LIN Hengfu; LIU Huiying; WU Dongyang; WANG Jie; XU Zeliang

doi:10.7498/aps.75.20251567

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XU Luya, LIN Hengfu, LIU Huiying, WU Dongyang, WANG Jie, XU Zeliang. Point defects in the semiconducting β-TeO2 monolayer : Structural stability and electronic propertiesJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251567

Citation:

XU Luya, LIN Hengfu, LIU Huiying, WU Dongyang, WANG Jie, XU Zeliang. Point defects in the semiconducting β-TeO2 monolayer : Structural stability and electronic propertiesJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251567

Citation:

XU Luya, LIN Hengfu, LIU Huiying, WU Dongyang, WANG Jie, XU Zeliang. Point defects in the semiconducting β-TeO2 monolayer : Structural stability and electronic propertiesJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251567