Reliability Study of Schottky-Type p-GaN HEMTs under Surge Current Stress

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PENG Rong; QIU Binju; HUANG Shuting; WANG Long; ZHANG Bo; ZHOU Qi

doi:10.7498/aps.75.20251573

PENG Rong, QIU Binju, HUANG Shuting, WANG Long, ZHANG Bo, ZHOU Qi. Reliability Study of Schottky-Type p-GaN HEMTs under Surge Current StressJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251573

Citation:

PENG Rong, QIU Binju, HUANG Shuting, WANG Long, ZHANG Bo, ZHOU Qi. Reliability Study of Schottky-Type p-GaN HEMTs under Surge Current StressJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251573

Citation:

PENG Rong, QIU Binju, HUANG Shuting, WANG Long, ZHANG Bo, ZHOU Qi. Reliability Study of Schottky-Type p-GaN HEMTs under Surge Current StressJ. Acta Physica Sinica. DOI: 10.7498/aps.75.20251573