Wide bandgap high power electronic device junction temperature measurement technology

ZHANG Jingwen; WANG Shuai; SHI Shang; MA Mingyang; WANG Zexu; HAO Menglong

doi:10.7498/aps.75.20260106

Search

x

2019中国必威常用网址

ZHANG Jingwen, WANG Shuai, SHI Shang, MA Mingyang, WANG Zexu, HAO Menglong. Wide bandgap high power electronic device junction temperature measurement technologyJ. Acta Physica Sinica, 2026, 75(7): 070807. DOI: 10.7498/aps.75.20260106

Citation:

ZHANG Jingwen, WANG Shuai, SHI Shang, MA Mingyang, WANG Zexu, HAO Menglong. Wide bandgap high power electronic device junction temperature measurement technologyJ. Acta Physica Sinica, 2026, 75(7): 070807. DOI: 10.7498/aps.75.20260106

Citation:

ZHANG Jingwen, WANG Shuai, SHI Shang, MA Mingyang, WANG Zexu, HAO Menglong. Wide bandgap high power electronic device junction temperature measurement technologyJ. Acta Physica Sinica, 2026, 75(7): 070807. DOI: 10.7498/aps.75.20260106