A review of simulation, measurement techniques, and development in chip thermal design

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ZHOU Junnian; ZHOU Feng; YUE Shengying

doi:10.7498/aps.75.20251780

ZHOU Junnian, ZHOU Feng, YUE Shengying. A review of simulation, measurement techniques, and development in chip thermal designJ. Acta Physica Sinica, 2026, 75(7): 070806. DOI: 10.7498/aps.75.20251780

Citation:

ZHOU Junnian, ZHOU Feng, YUE Shengying. A review of simulation, measurement techniques, and development in chip thermal designJ. Acta Physica Sinica, 2026, 75(7): 070806. DOI: 10.7498/aps.75.20251780

Citation:

ZHOU Junnian, ZHOU Feng, YUE Shengying. A review of simulation, measurement techniques, and development in chip thermal designJ. Acta Physica Sinica, 2026, 75(7): 070806. DOI: 10.7498/aps.75.20251780