Acta Physica Sinica //m.getgobooth.com/ 必威体育下载 daily 15 2024-10-24 17:40:08 apsoffice@iphy.ac.cn apsoffice@iphy.ac.cn 2024-10-24 17:40:08 zh Copyright ©Acta Physica Sinica All Rights Reserved. 京ICP备05002789号-1 Address: PostCode:100190 Phone: 010-82649829,82649241,82649863 Email: apsoffice@iphy.ac.cn Copyright ©Acta Physica Sinica All Rights Reserved apsoffice@iphy.ac.cn 1000-3290 <![CDATA[在交流电弧中利用分馏法对金属铝中微量杂质的光谱定量分析]]> //m.getgobooth.com/en/article/doi/10.7498/aps.17.43 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1961 17(10): 43-47. Published 1961-05-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1961 17(10): 43-47. Published 1961-05-05 在交流电弧中利用分馏法对金属铝中微量杂质的光谱定量分析 1961-05-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1961 17(10): 43-47. article doi:10.7498/aps.17.43 10.7498/aps.17.43 Acta Physica Sinica 17 10 1961-05-05 //m.getgobooth.com/en/article/doi/10.7498/aps.17.43 43-47 <![CDATA[He中N<sub<2</sub<的光谱定量分析]]> //m.getgobooth.com/en/article/doi/10.7498/aps.17.48 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1961 17(10): 48-51. Published 1961-05-05 Author(s): <br/><p></p> <br/>Acta Physica Sinica. 1961 17(10): 48-51. Published 1961-05-05 He中N&lt;sub&lt;2&lt;/sub&lt;的光谱定量分析 1961-05-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1961 17(10): 48-51. article doi:10.7498/aps.17.48 10.7498/aps.17.48 Acta Physica Sinica 17 10 1961-05-05 //m.getgobooth.com/en/article/doi/10.7498/aps.17.48 48-51 <![CDATA[SURFACE IMPEDANCE AND TRANSPARENT COEFFICIENT OF METALS IN THE INFRARED]]> //m.getgobooth.com/en/article/doi/10.7498/aps.17.453 Author(s): HAO BAI-LIN <br/><p>Surface impedance of metals in infrared region is calculated for an arbitrary Fermi surface. Expressions applicable to all cases of skin-effect (normal, anomalous and intermediate) are obtained. For anomalous skin-effect a component of electric field decreases very slowly in the depth of metals, which leads to the transparency of metallic films. It is proposed to develop a contactless method for the purity control of well refined metals by means of this effect. Surface impedance in a perpendicular magnetic field is also considered.</p> <br/>Acta Physica Sinica. 1961 17(10): 453-464. Published 1961-05-05 Author(s): HAO BAI-LIN <br/><p>Surface impedance of metals in infrared region is calculated for an arbitrary Fermi surface. Expressions applicable to all cases of skin-effect (normal, anomalous and intermediate) are obtained. For anomalous skin-effect a component of electric field decreases very slowly in the depth of metals, which leads to the transparency of metallic films. It is proposed to develop a contactless method for the purity control of well refined metals by means of this effect. Surface impedance in a perpendicular magnetic field is also considered.</p> <br/>Acta Physica Sinica. 1961 17(10): 453-464. Published 1961-05-05 SURFACE IMPEDANCE AND TRANSPARENT COEFFICIENT OF METALS IN THE INFRARED HAO BAI-LIN 1961-05-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1961 17(10): 453-464. article doi:10.7498/aps.17.453 10.7498/aps.17.453 Acta Physica Sinica 17 10 1961-05-05 //m.getgobooth.com/en/article/doi/10.7498/aps.17.453 453-464 <![CDATA[THE INFLUENCE OF WORKING CONDITIONS OF X-RAY DIFFRACTOMETER ON THE POSITION OF THE CENTRE OF GRAVITY,THE MEAN-SQUARE WIDTH AND THE PROFILE OF INTERFERENCE LINES]]> //m.getgobooth.com/en/article/doi/10.7498/aps.17.465 Author(s): CHEN CHI <br/><p>In this article general formulas are derived which account for the influence of X-ray geometry, the nonideal adjustment of goniometer and the parameters of recording system on the centre of gravity, on the mean-square width and on the Fourier coefficients of the line profile. Several related problems are briefly discussed.</p> <br/>Acta Physica Sinica. 1961 17(10): 465-481. Published 1961-05-05 Author(s): CHEN CHI <br/><p>In this article general formulas are derived which account for the influence of X-ray geometry, the nonideal adjustment of goniometer and the parameters of recording system on the centre of gravity, on the mean-square width and on the Fourier coefficients of the line profile. Several related problems are briefly discussed.</p> <br/>Acta Physica Sinica. 1961 17(10): 465-481. Published 1961-05-05 THE INFLUENCE OF WORKING CONDITIONS OF X-RAY DIFFRACTOMETER ON THE POSITION OF THE CENTRE OF GRAVITY,THE MEAN-SQUARE WIDTH AND THE PROFILE OF INTERFERENCE LINES CHEN CHI 1961-05-05 Personal use only, all commercial or other reuse prohibited Acta Physica Sinica. 1961 17(10): 465-481. article doi:10.7498/aps.17.465 10.7498/aps.17.465 Acta Physica Sinica 17 10 1961-05-05 //m.getgobooth.com/en/article/doi/10.7498/aps.17.465 465-481