-
基于纠缠光子对的Hong-Ou-Mandel (HOM)干涉仪在量子精密测量等领域有着重要应用. 本文提出了利用一个级联HOM干涉仪实现多个独立时延参数的同时测量方案. 通过理论分析得出纠缠光子对经过多个50∶50分束器级联传输后, 其HOM二阶量子干涉图谱中凹陷位置与各级传输路径间独立时延参数的对应关系, 因此可通过记录各个凹陷位置的时延值实现多个独立时延参数的同时测量. 在此基础上搭建了基于频率一致纠缠光子对的二级级联HOM干涉测量装置, 通过实验上得到的具有两个对称凹陷的二阶量子干涉图谱, 实现了两级传输路径间两个独立时延参数
$ {\tau }_{1} $ 和$ {\tau }_{2} $ 的同时测量, 并分别获得了109 fs和98 fs的测量精度. 上述研究结果为HOM干涉仪在多参量量子精密测量系统中的扩展应用奠定基础.-
关键词:
- Hong-Ou-Mandel干涉仪/
- 纠缠光子对/
- 多时延参数/
- 同时测量
The Hong-Ou-Mandel (HOM) interferometer using entangled photon source possesses important applications in quantum precision measurement and relevant areas. In this paper, a simultaneous measurement scheme of multiple independent delay parameters based on a cascaded HOM interferometer is proposed. The cascaded HOM interferometer is composed of $ n $ concatenated 50∶50 beam splitters and independent delay parameters$ {\tau }_{1} $ ,$ {\tau }_{2} $ , ···,$ {\tau }_{n} $ . The numbers$ n=1, 2\;\mathrm{a}\mathrm{n}\mathrm{d}\;3 $ refer to the standard HOM interferometer, the second-cascaded HOM interferometer, and the third-cascaded HOM interferometer, respectively. Through the theoretical study of the cascaded HOM interference effect based on frequency entangled photon pairs, it can be concluded that there is a corresponding relationship between the dip position and the independent delay parameter in the second-order quantum interferogram. In the standard HOM interferometer, there is a dip in the second-order quantum interferogram, which can realize the measurement of delay parameter$ {\tau }_{1} $ . In the second-cascaded HOM interferometer, there are two symmetrical dips in the second-order quantum interferogram, which can realize the simultaneous measurement of two independent delay parameters$ {\tau }_{1} $ and$ {\tau }_{2} $ . By analogy, in the third-cascaded HOM interferometer, there are six symmetrical dips in the second-order quantum interferogram, which can realize the simultaneous measurement of three independent delay parameters$ {\tau }_{1} $ ,$ {\tau }_{2} $ and$ {\tau }_{3} $ . Therefore, multiple independent delay parameters can be measured simultaneously based on a cascaded HOM interferometer.In the experiment, the second-cascaded HOM interferometer based on frequency entangled photon source is built. The second-order quantum interferogram of the second-cascaded HOM interferometer is obtained by the coincidence measurement device. Two independent delay parameters $ {\tau }_{1} $ and$ {\tau }_{2} $ are measured simultaneously by recording the positions of two symmetrical dips, which are in good agreement with the theoretical results. At an averaging time of 3000 s, the measurement accuracy of two delay parameters$ {\tau }_{1} $ and$ {\tau }_{2} $ can reach 109 and 98 fs, respectively. These results lay a foundation for extending the applications of HOM interferometer in multi-parameter quantum systems.-
Keywords:
- Hong-Ou-Mandel interferometer/
- entangled photon pairs/
- multiple delay parameters/
- simultaneous measurement
[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24] -
[1] [2] [3] [4] [5] [6] [7] [8] [9] [10] [11] [12] [13] [14] [15] [16] [17] [18] [19] [20] [21] [22] [23] [24]
下载:
计量
- 文章访问数:5515
- PDF下载量:146
- 被引次数:0