| [1] |
Hua Ying-Xin, Chen Xiao-Hui, Li Jun, Hao Long, Sun Yi, Wang Yu-Feng, Geng Hua-Yun.In situX-ray diffraction measurement of shock melting in vanadium. Acta Physica Sinica, 2022, 71(7): 076201.doi:10.7498/aps.71.20212065 |
| [2] |
Yang Jun-Liang, Li Zhong-Liang, Li Tang, Zhu Ye, Song Li, Xue Lian, Zhang Xiao-Wei.Characteristics of multi-crystals monfiguration X-ray diffraction and application in characterizing synchrotron beamline bandwidth. Acta Physica Sinica, 2020, 69(10): 104101.doi:10.7498/aps.69.20200165 |
| [3] |
Chen Xiao-Hui, Tan Bo-Zhong, Xue Tao, Ma Yun-Can, Jin Sai, Li Zhi-Jun, Xin Yue-Feng, Li Xiao-Ya, Li Jun.In situobservation of phase transition in polycrystalline under high-pressure high-strain-rate shock compression by X-ray diffraction. Acta Physica Sinica, 2020, 69(24): 246201.doi:10.7498/aps.69.20200929 |
| [4] |
Gao Feng-Ju.Calculation of coherent X-ray diffraction from bent Cu nanowires. Acta Physica Sinica, 2015, 64(13): 138102.doi:10.7498/aps.64.138102 |
| [5] |
Qi Jun-Cheng, Ye Lin-Lin, Chen Rong-Chang, Xie Hong-Lan, Ren Yu-Qi, Du Guo-Hao, Deng Biao, Xiao Ti-Qiao.Coherence of X-ray in the third synchrotron radiation source. Acta Physica Sinica, 2014, 63(10): 104202.doi:10.7498/aps.63.104202 |
| [6] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
| [7] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
| [8] |
WANG LIU-DING, CHEN CHANG-LE, LIU LIN, KANG MO-KUANG, JI BANG-JIE, WEI YING-HUI.COMPUTER SIMULATION OF X-RAY DIFFRACTION PROFILES AND TEM DIFFRACTION PATTERNS ON ORDERING FOR Cu-4wt%Ti ALLOY. Acta Physica Sinica, 2000, 49(5): 926-930.doi:10.7498/aps.49.926 |
| [9] |
LUO JIAN, YAN HONG, TAO KUN.X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION. Acta Physica Sinica, 1995, 44(11): 1788-1792.doi:10.7498/aps.44.1788 |
| [10] |
LUO JIAN, TAO KUN.COMPUTER DEPTH PROFILING ANALYSIS METHOD FOR X-RAY DIFFRACTION POLYCRYSTALLINE PATTERNS. Acta Physica Sinica, 1995, 44(11): 1793-1797.doi:10.7498/aps.44.1793 |
| [11] |
ZHANG JIAN-ZHONG, CAO YAN-NI.SIMULATION STUDY OF DIVERGENT BEAM X-RAY DIFFRACTION BY CRYSTALS. Acta Physica Sinica, 1990, 39(1): 124-128.doi:10.7498/aps.39.124 |
| [12] |
BIAN WEI-MIN.INDEXING OF ELECTRON DIFFRACTION PATTERN OF ICOSAHEDRAL PHASE IN Al-Mn ALLOY. Acta Physica Sinica, 1989, 38(6): 998-1004.doi:10.7498/aps.38.998 |
| [13] |
FAN DE-PEI, HAN FU-SEN.THE INDEXING OF BACK-REFLECTION KOSSEL DIFFRACTION PATTERNS. Acta Physica Sinica, 1986, 35(2): 261-265.doi:10.7498/aps.35.261 |
| [14] |
SUN ZhANG-DE.SOLVING THE EQUATION OF X-RAY DIFFRACTION BY GREEN'S FUNCTION. Acta Physica Sinica, 1983, 32(8): 982-989.doi:10.7498/aps.32.982 |
| [15] |
GUO CHANG-LIN, MA LI-TAI.AN ANALYTICAL METHOD FOR INDEXING X-RAY POWDER PATTERNS OF MONOCLINIC SUBSTANCES. Acta Physica Sinica, 1983, 32(1): 1-14.doi:10.7498/aps.32.1 |
| [16] |
ZHANG SEN, FENG GUO-LIANG, WEI ZHANG-FU, GU GEN-QING.X-RAY STEREOSCOPIC IMAGE DISPLAY. Acta Physica Sinica, 1981, 30(9): 1264-1269.doi:10.7498/aps.30.1264 |
| [17] |
XU JI-AN, HU JING-ZHU.X-RAY DIFFRACTION UNDER HIGH PRESSURE. Acta Physica Sinica, 1977, 26(6): 521-525.doi:10.7498/aps.26.521 |
| [18] |
WU TE-CHAN, WANG JEN-HUI.THE THERMAL DIFFUSE X-RAY SCATTERING AND ELASTIC CONSTANTS OF ZINC. Acta Physica Sinica, 1966, 22(5): 533-540.doi:10.7498/aps.22.533 |
| [19] |
SHAW NAN, LIU YI-HUAN.X-RAY MEASUREMENT OF THE THERMAL EXPANSION OF GERMANIUM, SILICON, INDIUM ANTIMONIDE AND GALLIUM ARSENIDE. Acta Physica Sinica, 1964, 20(8): 699-704.doi:10.7498/aps.20.699 |
| [20] |
.. Acta Physica Sinica, 1963, 19(3): 202-204.doi:10.7498/aps.19.202 |
下载: