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Yang Dong, Li Zhongwen, Tian Yuan, Sun Shuaishuai, Tian Huanfang, Yang Huaixin, Li Jianqi.Photo-emission Electron Gun and Electron Optical Simulation for Ultrafast Scanning Electron Microscope. Acta Physica Sinica, 2024, 73(22): .doi:10.7498/aps.73.20241245 |
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Liu Xuan-Xuan, Guo Hong-Xuan, Xu Tao, Yin Kui-Bo, Sun Li-Tao.In-situliquid phase transmission electron microscope and its application in nanoparticle characterization. Acta Physica Sinica, 2021, 70(8): 086701.doi:10.7498/aps.70.20201899 |
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Ren Feng, Yin Sheng-Yi, Lu Zhi-Peng, Li Yang, Wang Yu, Zhang Shen-Jin, Yang Feng, Wei Dong.Applications of deep ultraviolet laser photo-and thermal-emission electron microscope in thermal dispenser cathode research. Acta Physica Sinica, 2017, 66(18): 187901.doi:10.7498/aps.66.187901 |
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Zhang Chao, Fang Liang, Sui Bing-Cai, Xu Qiang, Wang Hui.Nano-scale lithography and in-situ electrical measurements based on the micro-chips in a transmission electron microscope. Acta Physica Sinica, 2014, 63(24): 248105.doi:10.7498/aps.63.248105 |
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WANG ZHEN-XIA, RUAN MEI-LING, YANG JIN-QING, WANG WEN-MIN, YU GUO-QING.INVESTIGATION OF THE NOVEL CARBON NANOSTRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1999, 48(11): 2092-2097.doi:10.7498/aps.48.2092 |
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WANG ZHEN-XIA, HU JUN, WANG WEN-MIN, YU GUO-QING, RUAN MEI-LING.A HIGH RESOLUTION ELECTRON MICROSCOPY INVESTIGATION OF CURVATURE IN MULTILAYER GRAPHITE SHEETS. Acta Physica Sinica, 1998, 47(11): 1853-1857.doi:10.7498/aps.47.1853 |
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LI YI-JIE, XIONG GUANG-CHENG, GAN ZI-ZHAO, REN CONG-XIN, ZOU SHI-CHANG.TEM STUDY OF MICROSTRUCTURAL CHANGES INDUCED BY AR ION IMPLANTATION IN YBa2Cu3O7-x SUPERCONDUCTING FILMS. Acta Physica Sinica, 1993, 42(3): 482-487.doi:10.7498/aps.42.482 |
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LI LONG, LI FANG-HUA, YANG DA-YU, TIAN LING-HUA, LIN ZHEN-JIN.ELECTRON DIFFRACTION AND HIGH RESOLUTION MICRO-SCOPY STUDY ON INCOMMENSURATE MODULATED STRUCTURE IN Ce1+εFe4B4 ALLOY. Acta Physica Sinica, 1990, 39(5): 788-792.doi:10.7498/aps.39.788 |
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YANG CUI-YING, ZHANG DAO-FAN, WU XING, ZHOU YU-QING, FENG GUO-GUANG.ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO3 CRYSTAL. Acta Physica Sinica, 1989, 38(12): 2003-2007.doi:10.7498/aps.38.2003 |
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HEI ZU-KUN, GUO YONG-XIANG.A TEM STUDY OF CRYSTALLIZATION OF AMORPHOUS Ni-Zr ALLOY (Ⅱ)——TRANSITION AREA FORMED DURING CRYSTALLIZATION OF Ni-33at%Zr. Acta Physica Sinica, 1989, 38(12): 2034-2038.doi:10.7498/aps.38.2034 |
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SHEN XIAO-QING.A STUDY ON IMAGE QUALITY DEPENDING ON DEFOCUSING HREM WITH IMAGE QUALIFICATION THEORY OF LINFOOT. Acta Physica Sinica, 1989, 38(3): 516-522.doi:10.7498/aps.38.516 |
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GUO YONG-XIANG, HEI ZU-KUN, WU YU-KUN, GUO KE-XIN.A TEM STUDY OF THE CRYSTALLIZATION OF AMORPHOUS Ni-Zr ALLOY(I)——METASTABLE PHASES FORMED DURING CRYSTALLIZATION OF Ni67Zr33. Acta Physica Sinica, 1986, 35(3): 359-364.doi:10.7498/aps.35.359 |
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ZHANG JING, LIU AN-SHENG, WU ZI-QIN, GUO KE-XIN.A TEM STUDY OF Pd-Si THIN FILM SOLID-PHASE REACTION. Acta Physica Sinica, 1986, 35(7): 965-968.doi:10.7498/aps.35.965 |
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KONG QING-PING, ANG XIANG, NI QUN-HUI.OBSERVATIONS ON HIGH TEMPERATURE CREEP PROCESSES OF A NICKEL BASE ALLOY BY TRANSMISSION ELECTRON MICROSCOPY. Acta Physica Sinica, 1985, 34(7): 973-977.doi:10.7498/aps.34.973 |
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WEN SHU-LIN, FENG JING-WEI.LATTICE DEFECTS IN α-Si3N4 STUDIED BY HREM. Acta Physica Sinica, 1985, 34(7): 951-955.doi:10.7498/aps.34.951 |
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YANG CUI-YING, ZHOU YU-QING, ZHAO JIAN-GAO.AN ELECTRON MICROSCOPIC STUDY ON AMORPHOUS Tb-Fe THIN FILMS. Acta Physica Sinica, 1982, 31(2): 180-184.doi:10.7498/aps.31.180 |
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LI FANG-HUA, FAN HAN-JIE, YANG DA-YU, FU PING-QIU, KONG YOU-HUA.ELECTRON MICROSCOPY OF HUANGHOITE. Acta Physica Sinica, 1982, 31(5): 571-576.doi:10.7498/aps.31.571 |
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CHENG PENG-ZHU, MA XIAO-HUA, LUO QI-GUANG, YANG DA-YU.THE PREPARATION OF TRANSMISSION ELECTRON MICROSCOPE SPECIMEN BY ELECTROLYTIC POLISHING METHOD. Acta Physica Sinica, 1981, 30(2): 286-290.doi:10.7498/aps.30.286 |
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GUO KE-XIN, LIN BAO-JUN.A TEM STUDY OF PARTIAL DISLOCATIONS IN A NICKEL-CHROMIUM ALLOY. Acta Physica Sinica, 1980, 29(4): 494-499.doi:10.7498/aps.29.494 |
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Li Fang-hua.DETERMINATION OF CRYSTAL STRUCTURES BY HIGH RESOLUTION ELECTRON MICROSCOPY. Acta Physica Sinica, 1977, 26(3): 193-198.doi:10.7498/aps.26.193 |
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