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Xu Si-Wei, Wang Xun-Si, Shen Xiang.Structure of GexGa8S92–xglasses studied by high-resolution X-ray photoelectron spectroscopy and Raman scattering. Acta Physica Sinica, 2023, 72(1): 017101.doi:10.7498/aps.72.20221653 |
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Yang Meng-Sheng, Yi Tai-Min, Zheng Feng-Cheng, Tang Yong-Jian, Zhang Lin, Du Kai, Li Ning, Zhao Li-Ping, Ke Bo, Xing Pi-Feng.Surface oxidation of as-deposit uranium film characterized by X-ray photoelectron spectroscopy. Acta Physica Sinica, 2018, 67(2): 027301.doi:10.7498/aps.67.20172055 |
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Xu Si-Wei, Wang Li, Shen Xiang.Raman scattering and X-ray photoelectron spectra of GexSb20Se80-x Glasses. Acta Physica Sinica, 2015, 64(22): 223302.doi:10.7498/aps.64.223302 |
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Yang Fa-Zhan, Shen Li-Ru, Wang Shi-Qing, Tang De-Li, Jin Fa-Ya, Liu Hai-Feng.UV Raman and XPS studies of hydrogenous diamond-like carbon films prepared by PECVD. Acta Physica Sinica, 2013, 62(1): 017802.doi:10.7498/aps.62.017802 |
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Han Lu-Hui, Zhang Chong-Hong, Zhang Li-Qing, Yang Yi-Tao, Song Yin, Sun You-Mei.X-ray photoelectron spectroscopy study on GaN crystal irradiated by slow highly charged ions. Acta Physica Sinica, 2010, 59(7): 4584-4590.doi:10.7498/aps.59.4584 |
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Feng Yu-Qing, Zhao Kun, Zhu Tao, Zhan Wen-Shan.Thermal stability of magnetic tunnel junctions investigated by x-ray photoelectron spectroscopy. Acta Physica Sinica, 2005, 54(11): 5372-5376.doi:10.7498/aps.54.5372 |
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He Shao-Long, Li Hong-Nian, Li Hai-Yang, Zhang Han-Jie, Lü Bin, He Pi-Mo, Bao Shi-Ning, Xu Ya-Bo.X-ray photoemission studies of Yb intercalated C60 thin film. Acta Physica Sinica, 2004, 53(3): 915-921.doi:10.7498/aps.53.915 |
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Cui Da-Fu, Wang Huan-Hua, Dao Shou-Yu, Zhou Yue-Liang, ＣｈｅｎＺｈｅｎｇ Ｈａｏ, Yang Guo-Zheng, Liu Feng-Qin, Ｋ .Ｉｂｒａｈｉｍ, Qian Hai-Jie.. Acta Physica Sinica, 2002, 51(1): 187-191.doi:10.7498/aps.51.187 |
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YUAN JIN-SHE, CHEN GUANG-DE, QI MING, LI AI-ZHEN, XU ZHUO.XPS AND AES INVESTIGATION OF GaN FILMS GROWN BY MBE. Acta Physica Sinica, 2001, 50(12): 2429-2433.doi:10.7498/aps.50.2429 |
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Li Yi, Yi Xin－jian, Cai Li－ping.Study on the Oxidative Characterization of Lpe HgCdTe Film Surface by XPS . Acta Physica Sinica, 2000, 49(1): 132-136.doi:10.7498/aps.49.132 |
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JI ZHEN-GUO, CHEN LI-DENG, MA XIANG-YANG, YAO HONG-NIAN, QUE DUAN-LIN.. Acta Physica Sinica, 1995, 44(1): 57-63.doi:10.7498/aps.44.57 |
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SHI YI-SHENG, ZHAO TE-XIU, LIU HONG-TU, WANG XIAO-PING.XPS AND AES STUDY FOR Pd/W/Si(lll) BILAYER INTERFACE. Acta Physica Sinica, 1992, 41(11): 1849-1855.doi:10.7498/aps.41.1849 |
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CHEN XIAN-HUI, QIAN YI-TAI, CHEN ZU-YAO, ZHO JUN-HUA, JI MING-RONG.XPS STUDIES OF Bi2Sr2CaCu2-xLixOy CERAMICS SERFACES. Acta Physica Sinica, 1992, 41(9): 1487-1492.doi:10.7498/aps.41.1487 |
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MENG GE, SHEN DIAN-HONG, LI NAN, XIE KAN, LIN ZHANG-DA, WANG YU-HE, LI LIN.XPS STUDIES OF Ti/BiSMUTH-BASED SUPERCONDUCTOR INTERFACE REACTIONS. Acta Physica Sinica, 1991, 40(12): 1992-1998.doi:10.7498/aps.40.1992 |
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Wang Nan-lin, Tan Ming-qiu, Zhao Zhan-chun, Wang Jing-song, Sha Jian, Liu Xian-ming, Ji Ming-rong, Zhang Qi-rui.X-RAY PHOTOELECTRON SPECTROSCOPY STUDY ON THE HOLE STATES IN YBa2Cu3O7 SUPERCONDUCTOR. Acta Physica Sinica, 1991, 40(5): 821-825.doi:10.7498/aps.40.821 |
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ZHONG ZHAN-TIAN, WANG DA-WEN, LIAO XIAN-BO, FAN YUE, LI CHENG-FANG, MOU SHAN-MING.XPS AND AES STUDY FOR Au/a-Si:H INTERFACE. Acta Physica Sinica, 1991, 40(2): 275-280.doi:10.7498/aps.40.275 |
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ZHAO LIANG-ZHONG.XPS STUDIES OF A SERIES OF Ce(Ⅳ) AND Ce(Ⅲ) COMPOUNDS. Acta Physica Sinica, 1989, 38(6): 987-990.doi:10.7498/aps.38.987 |
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ZHANG HAN, HE ZHEN-HUI, ZHAO YONG, SUN SHI-FANG, QIAN YI-TAI, ZHANG QI-RUI.AN XPS STUDY ON Y-Ba-Cu-Al-O SYSTEM. Acta Physica Sinica, 1989, 38(4): 689-693.doi:10.7498/aps.38.689 |
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GUO HUI-QUN, ZHAN WEN-SHAN, SHEN BAO-GEN, ZHANG ZHI-YING, WANG CHANG-HENG, XIE KAN, QI SHANG-XUE, PAN XIAO-SHUO.X-RAY PHOTOELECTRON SPECTROSCOPY OF AMORPHOUS (Fe1-x Cox)78 Si9.5B12.5 ALLOYS. Acta Physica Sinica, 1986, 35(8): 1077-1080.doi:10.7498/aps.35.1077 |
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Yu Ming-ren, Yang Guang, Wang Xun.DETERMINATION OF THE ATOMIC CONCENTRATION RATIO ON InP (100) CLEAN SURFACES BY X-RAY PHOTOELECTRON SPECTROSCOPY. Acta Physica Sinica, 1983, 32(6): 799-802.doi:10.7498/aps.32.799 |
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