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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Ma Hong-Wei, Liang Jing-Kui.A new approach to extract reliable intensities of non-equivalent systematical overlapping reflections from powder diffraction data. Acta Physica Sinica, 2004, 53(3): 829-834.doi:10.7498/aps.53.829 |
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QI ZE-MING, SHI CHAO-SHU, WANG ZHENG, WEI YA-GUANG, XIE YA-NING, HU TIAN-DOU, LI FU-LI.AMORPHOUS AND NANOCRYSTALLINE ZrO2·Y2O3(15%) STUDIED BY EXTENDED X-RAY ABSORPTION FINE STRUCTURE. Acta Physica Sinica, 2001, 50(7): 1318-1323.doi:10.7498/aps.50.1318 |
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LIU HONG-CHAO, GUO CHANG-LIN.X-RAY POWDER DIFFRACTION RIETVELD METHOD IN-QUANTITATIVE DETERMINATION OF SiC POLYTYPES. Acta Physica Sinica, 1997, 46(3): 524-529.doi:10.7498/aps.46.524 |
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LUO JIAN, YAN HONG, TAO KUN.X-RAY DIFFRACTION PHASE DEPTH PROFILING FOR POLYCRYSTAL WITH CONTINUOUS PHASE DEPTH DISTRIBUTION. Acta Physica Sinica, 1995, 44(11): 1788-1792.doi:10.7498/aps.44.1788 |
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GUO CHANG-LIN, HUANG YUE-HONG.STABLE SOLUTIONS OF THE LEAST SQUARE SIMULTANEOUS EQUATIONS IN QUANTITATIVE X-RAY PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1993, 42(7): 1106-1111.doi:10.7498/aps.42.1106 |
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LI CHAO-RONG, MAI ZHEN-HONG, P. D. HATTON, C. H. DU.X-RAY TRIPLE AXIS SCATTERING STUDIES OF YBa2Cu3Oy SUPERCONDUCTING THIN FILM. Acta Physica Sinica, 1993, 42(9): 1479-1484.doi:10.7498/aps.42.1479 |
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WANG WEI-HUA, BAI HAI-YANG, ZHANG YUN, CHEN HONG, WANG WEN-KUI.STUDY THE DIFFUSION MECHANISM OF Ni IN AMORPHOUS Si BY X-RAY DIFFRACTION. Acta Physica Sinica, 1993, 42(9): 1505-1509.doi:10.7498/aps.42.1505 |
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ZHOU GUO-LIANG, SHEN XIAO-LIANG, SHENG CHI, JIANG WEI-DONG, YU MING-REN.SMALL-ANGLE X-RAY DIFFRACTION ANALYSIS OF GexSi1-x/Si SUPERLATTICE. Acta Physica Sinica, 1991, 40(1): 56-63.doi:10.7498/aps.40.56 |
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TENG FENG-EN, HAN WEI, LIU YAN-LING, WANG YU-MING.X-RAY PROFILE ANALYSIS ON DEFORMED SEMICRYSTAL LINE POLYETHYLENE FILMS. Acta Physica Sinica, 1991, 40(12): 1955-1959.doi:10.7498/aps.40.1955 |
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WANG XIN-JIU, ZHAO JING-AN, CHENG HONG-FEI, TAO KUN, WANG LIANG-YU, PEI XUE-FENG.AN X-RAY STUDY OF MESOPHASE OF BOWL-LIKE COMPOUNDS. Acta Physica Sinica, 1988, 37(10): 1729-1734.doi:10.7498/aps.37.1729 |
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GUO CHANG-LIN, YAO GONG-DA.NEW GENERAL METHOD OF X-RAY DIFFRACTION QUANTITATIVE PHASE ANALYSIS WITHOUT STANDARDS. Acta Physica Sinica, 1985, 34(11): 1451-1460.doi:10.7498/aps.34.1451 |
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YAO GONG-DA, GUO CHANG-LIN.MULTIPHASE DOPING METHOD IN QUANTITATIVE X-RAY DIFFRACTION PHASE ANALYSIS. Acta Physica Sinica, 1985, 34(11): 1461-1468.doi:10.7498/aps.34.1461 |
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WAN DE-RUI, FENG JIAN-QING, ZENG JIA-YU, LIU XAO-GUANG, ZHONG YUAN-QING.QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY COMPOUNDS WITHOUT STANDARD SAMPLES. Acta Physica Sinica, 1984, 33(6): 762-769.doi:10.7498/aps.33.762 |
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CHEN YONG-QI, MAO YUN-JING.CALCULATION OF THE DEPTH DISTRIBUTION OF X-RAY φ(ρz) AND QUANTITATIVE ELECTRON PROBE MICROANALYSIS. Acta Physica Sinica, 1984, 33(5): 621-628.doi:10.7498/aps.33.621 |
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ZHANG REN-JI, GE SEN-LIN, WU ZI-QIN.NO-STANDARDS QUANTITATIVE EDS ANALYSIS OF THE CONSTITUENTS OF BINARY ALLOYS CONTAINING LIGHT ELEMENTS. Acta Physica Sinica, 1981, 30(2): 208-217.doi:10.7498/aps.30.208 |
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JIN LONG-HUAN, CHANG LONG-CHUN.X-RAY STRUCTURE ANALYSIS OF AMORPHOUS ALLOYS FeCoSiB, FeSiB AND FeB. Acta Physica Sinica, 1980, 29(10): 1275-1282.doi:10.7498/aps.29.1275 |
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GUO CHANG-LIN.QUANTITATIVE DETERMINATION OF SPECTRAL PURITY OF X-RAY TUBES FOR DIFFRACTION ANALYSIS. Acta Physica Sinica, 1980, 29(1): 35-45.doi:10.7498/aps.29.35 |
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