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Zhang Guan-Jie, Yang Hao, Zhang Nan.Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica, 2020, 69(12): 127711.doi:10.7498/aps.69.20200301 |
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Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
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Li Xiao-Dong, Li Hui, Li Peng-Shan.High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica, 2017, 66(3): 036203.doi:10.7498/aps.66.036203 |
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Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De.Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica, 2013, 62(4): 048801.doi:10.7498/aps.62.048801 |
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Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong.Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica, 2013, 62(14): 140701.doi:10.7498/aps.62.140701 |
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Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
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Lü Hui-Min, Shi Zhen-Hai, Zhao Chao, Wei Ping.Preparation and mechanism analysis of hollow microspheres/reticulated composite carbon foam. Acta Physica Sinica, 2010, 59(11): 7956-7960.doi:10.7498/aps.59.7956 |
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Zhang Yan-Hui, Chen Ping-Ping, Li Tian-Xin, Yin Hao.InNSb single crystal films prepared on GaAs (001) substrates by molecular beam epitaxy. Acta Physica Sinica, 2010, 59(11): 8026-8030.doi:10.7498/aps.59.8026 |
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Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang.Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica, 2010, 59(7): 4774-4780.doi:10.7498/aps.59.4774 |
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Li Jia, Yang Chuan-Zheng, Zhang Xi-Gui, Zhang Jian, Xia Bao-Jia.XRD studies on the electrode materials in the charge-discharge process of a graphite/Li（Ni1/3Co1/3Mn1/3）O2 battery. Acta Physica Sinica, 2009, 58(9): 6573-6581.doi:10.7498/aps.58.6573 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
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Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Sun Guang-Ai, Chen Bo, Du Hong-Lin.Anomalous thermal expansion of R(Fe, Mo)12 compounds. Acta Physica Sinica, 2005, 54(9): 4240-4244.doi:10.7498/aps.54.4240 |
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Liu Ying, Peng Chang-De, Lan Xiu-Feng, Luo Xiao-Sen, Shen Zhong-Hua, Lu Jian, Ni Xiao-Wu.Fluorescence spectrum characteristics of ethanol-water clusters. Acta Physica Sinica, 2005, 54(11): 5455-5461.doi:10.7498/aps.54.5455 |
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Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
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Hao Yan-Ming, Zhao Wei, Gao Yan.Structure and Curie temperature of Y2(Fe1-x-y,Coy,Crx)17 compounds. Acta Physica Sinica, 2003, 52(10): 2612-2615.doi:10.7498/aps.52.2612 |
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Wang Wen-Quan, Yan Yu, Wang Xue-Feng, Su Feng, Wang Xiang-Qun, Jin Han-Min.Structural and magnetic properties of RCo12-xTix(R=Y and Sm) compounds. Acta Physica Sinica, 2003, 52(1): 150-155.doi:10.7498/aps.52.150 |
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