[1] |
Zhang Guan-Jie, Yang Hao, Zhang Nan.Research progress of the investigation of intrinsic and extrinsic origin of piezoelectric materials by X-ray diffraction. Acta Physica Sinica, 2020, 69(12): 127711.doi:10.7498/aps.69.20200301 |
[2] |
Xu Feng1\2, Yu Guo-Hao, Deng Xu-Guang, Li Jun-Shuai, Zhang Li, Song Liang, Fan Ya-Ming, Zhang Bao-Shun.Current transport mechanism of Schottky contact of Pt/Au/n-InGaN. Acta Physica Sinica, 2018, 67(21): 217802.doi:10.7498/aps.67.20181191 |
[3] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
[4] |
Li Xiao-Dong, Li Hui, Li Peng-Shan.High pressure single-crystal synchrotron X-ray diffraction technique. Acta Physica Sinica, 2017, 66(3): 036203.doi:10.7498/aps.66.036203 |
[5] |
Chen Ren-Gang, Deng Jin-Xiang, Chen Liang, Kong Le, Cui Min, Gao Xue-Fei, Pang Tian-Qi, Miao Yi-Ming.Spectroscopic ellipsometry study of the Zn3N2 films prepared by radio-frequency sputtering. Acta Physica Sinica, 2014, 63(13): 137701.doi:10.7498/aps.63.137701 |
[6] |
Han Liang, Liu De-Lian, Chen Xian, Zhao Yu-Qing.The effect of the interlayer CrN on adhesion characteristics of ta-C films on high-speed steel substrate. Acta Physica Sinica, 2013, 62(9): 096802.doi:10.7498/aps.62.096802 |
[7] |
Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
[8] |
Lü Hui-Min, Shi Zhen-Hai, Zhao Chao, Wei Ping.Preparation and mechanism analysis of hollow microspheres/reticulated composite carbon foam. Acta Physica Sinica, 2010, 59(11): 7956-7960.doi:10.7498/aps.59.7956 |
[9] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
[10] |
Li Jia, Yang Chuan-Zheng, Zhang Xi-Gui, Zhang Jian, Xia Bao-Jia.XRD studies on the electrode materials in the charge-discharge process of a graphite/Li(Ni1/3Co1/3Mn1/3)O2 battery. Acta Physica Sinica, 2009, 58(9): 6573-6581.doi:10.7498/aps.58.6573 |
[11] |
Chang Jun, Li Hua, Han Ying-Jun, Tan Zhi-Yong, Cao Jun-Cheng.Material growth and characterization of terahertz quantum-cascade lasers. Acta Physica Sinica, 2009, 58(10): 7083-7087.doi:10.7498/aps.58.7083 |
[12] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
[13] |
Ming Bao-Quan, Wang Jin-Feng, Zang Guo-Zhong, Wang Chun-Ming, Gai Zhi-Gang, Du Juan, Zheng Li-Mei.X-ray diffraction and phase transition analysis for (K, Na)NbO3-based lead-free piezoelectric ceramics. Acta Physica Sinica, 2008, 57(9): 5962-5967.doi:10.7498/aps.57.5962 |
[14] |
Tan Guo-Tai, Chen Zheng-Hao.XRD analysis on lattice structure of La1-xTexMnO3. Acta Physica Sinica, 2007, 56(3): 1702-1706.doi:10.7498/aps.56.1702 |
[15] |
Lü Hui-Min, Chen Guang-De, Yan Guo-Jun, Ye Hong-Gang.The growth mechanism of monocrystal aluminum nitride nanowires at low temperature. Acta Physica Sinica, 2007, 56(5): 2808-2812.doi:10.7498/aps.56.2808 |
[16] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
[17] |
Wang Rui-Min, Chen Guang-De, Zhu You-Zhang.Micro-Raman scattering study of hexagonal InGaN epitaxial layer. Acta Physica Sinica, 2006, 55(2): 914-919.doi:10.7498/aps.55.914 |
[18] |
Zhang Xiao-Dan, Zhao Ying, Gao Yang-Tao, Zhu Feng, Wei Chang-Chun, Sun Jian, Geng Xin-Hua, Xiong Shao-Zhen.Fabrication of intrinsic microcrystalline silicon thin films used for solar cells and its structure. Acta Physica Sinica, 2005, 54(10): 4874-4878.doi:10.7498/aps.54.4874 |
[19] |
Sun Guang-Ai, Chen Bo, Du Hong-Lin.Anomalous thermal expansion of R(Fe, Mo)12 compounds. Acta Physica Sinica, 2005, 54(9): 4240-4244.doi:10.7498/aps.54.4240 |
[20] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |