[1] |
Li Qi-Zhu, Fan Hao-Han, Gao Zi-Heng, Nan Peng-Fei, Zhu Tie-Jun, Ge Bing-Hui.Nb0.8CoSb ordering transformation caused byin situheating-induced Nb diffusion. Acta Physica Sinica, 2024, 73(11): 116401.doi:10.7498/aps.73.20240325 |
[2] |
Li Hai-Tao, Jiang Ya-Xiao, Tu Li-Min, Li Shao-Hua, Pan Ling, Li Wen-Biao, Yang Shi-E, Chen Yong-Sheng.Influence of annealing temperature on properties of Cu2O thin films deposited by electron beam evaporation. Acta Physica Sinica, 2018, 67(5): 053301.doi:10.7498/aps.67.20172463 |
[3] |
Liu Hua-Song, Yang Xiao, Wang Li-Shuan, Jiang Cheng-Hui, Liu Dan-Dan, Ji Yi-Qin, Zhang Feng, Chen De-Ying.Gaussian oscillator model of the dielectric constant of SiO2 thin film in infrared range. Acta Physica Sinica, 2017, 66(5): 054211.doi:10.7498/aps.66.054211 |
[4] |
Guo Zhao-Long, Zhao Hai-Xin, Zhao Wei.Preparation and characterization of self-cleaning and anti-reflection ZnO-SiO2 nanometric films. Acta Physica Sinica, 2016, 65(6): 064206.doi:10.7498/aps.65.064206 |
[5] |
Li Wei-Qin, Zhang Hai-Bo, Lu Jun.Charging effects of SiO2 thin films under defocused electron beam irradiation. Acta Physica Sinica, 2012, 61(2): 027302.doi:10.7498/aps.61.027302 |
[6] |
Yang Jie, Wang Chong, Jin Ying-Xia, Li Liang, Tao Dong-ping, Yang Yu.Underlying strain-induced growth of the self-assembled Ge quantum-dots prepared by ion beam sputtering deposition. Acta Physica Sinica, 2012, 61(1): 016804.doi:10.7498/aps.61.016804 |
[7] |
Zhang Xue-Gui, Wang Chong, Lu Zhi-Quan, Yang Jie, Li Liang, Yang Yu.Evolution of Ge/Si quantum dots self-assembledgrown by ion beam sputtering. Acta Physica Sinica, 2011, 60(9): 096101.doi:10.7498/aps.60.096101 |
[8] |
Luo Yin-Yan, Zhu Xian-Fang.Effects of thermal evaporation and electron beam evaporation on two-dimensional patterned Ag nanostructure during nanosphere lithography. Acta Physica Sinica, 2011, 60(8): 086104.doi:10.7498/aps.60.086104 |
[9] |
Fan Ping, Cai Zhao-Kun, Zheng Zhuang-Hao, Zhang Dong-Ping, Cai Xing-Min, Chen Tian-Bao.Fabrication and characterization of Bi-Sb-Te based thin film thermoelectric generator prepared by ion beam sputtering deposition. Acta Physica Sinica, 2011, 60(9): 098402.doi:10.7498/aps.60.098402 |
[10] |
Yuan Wen-Jia, Zhang Yue-Guang, Shen Wei-Dong, Ma Qun, Liu Xu.Characteristics of Nb2O5 thin films deposited by ion beam sputtering. Acta Physica Sinica, 2011, 60(4): 047803.doi:10.7498/aps.60.047803 |
[11] |
Fan Ping, Zheng Zhuang-Hao, Liang Guang-Xing, Zhang Dong-Ping, Cai Xing-Min.Preparation and characterization of Sb2Te3 thermoelectric thin films by ion beam sputtering. Acta Physica Sinica, 2010, 59(2): 1243-1247.doi:10.7498/aps.59.1243 |
[12] |
Liu Liang, Ma Xiao-Bai, Nie Rui-Juan, Yao Dan, Wang Fu-Ren.Properties of MgB2 films fabricated under different conditions by ex-situ annealing of Mg/B multilayer precursor. Acta Physica Sinica, 2009, 58(11): 7966-7971.doi:10.7498/aps.58.7966 |
[13] |
.Properties of Co nano-films deposited on monocrystalline silicon surface by ion beam sputtering. Acta Physica Sinica, 2007, 56(12): 7158-7164.doi:10.7498/aps.56.7158 |
[14] |
Huang Li-Qing, Pan Hua-Qiang, Wang Jun, Tong Hui-Min, Zhu Ke, Ren Guan-Xu, Wang Yong-Chang.Spontaneous formation of ordered Sn nanodot array on porous anodic alumina membrane. Acta Physica Sinica, 2007, 56(11): 6712-6716.doi:10.7498/aps.56.6712 |
[15] |
Hou Hai-Hong, Sun Xi-Lian, Shen Yan-Ming, Shao Jian-Da, Fan Zheng-Xiu, Yi Kui.Roughness and light scattering properties of ZrO2 thin films deposited by electron beam evaporation. Acta Physica Sinica, 2006, 55(6): 3124-3127.doi:10.7498/aps.55.3124 |
[16] |
Zhang Dong-Ping, Qi Hong-Ji, Shao Jian-Da, Fan Rui-Ying, Fan Zheng-Xiu.Mechanism of nodule growth in ion beam sputtering films. Acta Physica Sinica, 2005, 54(3): 1385-1389.doi:10.7498/aps.54.1385 |
[17] |
Gu Pei-Fu, Chen Hai-Xing, Zheng Zhen-Rong, Liu Xu.Determination of the extinction coefficient of a weakly absorbing multilayer system. Acta Physica Sinica, 2005, 54(8): 3722-3725.doi:10.7498/aps.54.3722 |
[18] |
Qi Hong- Ji, Yi Kui, He Hong- Bo, Shao Jian- Da.The effect of sputtering particle energy on surface characteristics of Mo thin films. Acta Physica Sinica, 2004, 53(12): 4398-4404.doi:10.7498/aps.53.4398 |
[19] |
Yan Zhi-Jun, Wang Yin-Yue, Xu Run, Jiang Zui-Min.Structural characteristics of HfO2 films grown by e-beam evaporation. Acta Physica Sinica, 2004, 53(8): 2771-2774.doi:10.7498/aps.53.2771 |
[20] |
ZHU KAI-GUI, SHI JIAN-ZHONG, SHAO QING-YI.RAMAN SCATTERING FROM InAs NANOCRYSTALS EMBEDDED IN SiO2 THIN FILMS. Acta Physica Sinica, 2000, 49(11): 2304-2306.doi:10.7498/aps.49.2304 |