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Ren Zhi-Hong, Li Yan, Li Yan-Na, Li Wei-Dong.Development on quantum metrology with quantum Fisher information. Acta Physica Sinica, 2019, 68(4): 040601.doi:10.7498/aps.68.20181965 |
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Feng Xiao-Tian, Yuan Chun-Hua, Chen Li-Qing, Chen Jie-Fei, Zhang Ke-Ye, Zhang Wei-Ping.Quantum metrology with atom and light correlation. Acta Physica Sinica, 2018, 67(16): 164204.doi:10.7498/aps.67.20180895 |
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Fan Qian, Xu Jian-Gang, Song Hai-Yang, Zhang Yun-Guang.Effects of layer thickness and strain rate on mechanical properties of copper-gold multilayer nanowires. Acta Physica Sinica, 2015, 64(1): 016201.doi:10.7498/aps.64.016201 |
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Cao Yong-Ze, Wang Qiang, Li Guo-Jian, Ma Yong-Hui, Sui Xu-Dong, He Ji-Cheng.Effects of high magnetic field on the growth and magnetic properties of Fe-Ni nano-polycrystalline thin films with different thickness values. Acta Physica Sinica, 2015, 64(6): 067502.doi:10.7498/aps.64.067502 |
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Yang Xi-Yuan, Zhang Jin-Ping, Wu Yu-Rong, Liu Fu-Sheng.Simulation studies on the influence of nanofilm thickness on the elastic properties of B2-NiAl. Acta Physica Sinica, 2015, 64(1): 016803.doi:10.7498/aps.64.016803 |
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Yi Tai-Min, Xing Pi-Feng, Du Kai, Zheng Feng-Cheng, Yang Meng-Sheng, Xie Jun, Li Chao-Yang.Preparation and characteristic study of nanometer thickness depleted uranium / Au multilayer. Acta Physica Sinica, 2012, 61(8): 088103.doi:10.7498/aps.61.088103 |
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Pan Jia-Qi, Zhu Chen-Quan, Li Yu-Ren, Lan Wei, Su Qing, Liu Xue-Qin, Xie Er-Qing.Electrical and optical properties of Cu-Al-O thin films sputtered using non-stoichiometric target. Acta Physica Sinica, 2011, 60(11): 117307.doi:10.7498/aps.60.117307 |
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Tang Xin-Feng, Du Bao-Li, Xu Jing-Jing, Yan Yong-Gao.Synthesis and thermoelectric properties of nonstoichiometric AgSbTe2+ x compounds. Acta Physica Sinica, 2011, 60(1): 018403.doi:10.7498/aps.60.018403 |
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Zhang Wen-Tao, Zhu Bao-Hua, Xiong Xian-Ming, Huang Jing.Characteristics of deposition for neutral atoms in laser standing wave with different velocities. Acta Physica Sinica, 2011, 60(6): 063202.doi:10.7498/aps.60.063202 |
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Xu Gen-Jian, Tan Wei-Shi, Cao Hui, Deng Kai-Ming, Wu Xiao-Shan.Study on structural and transport properties of nonstoichiometric La0.67Sr0.33-x□xMnO3. Acta Physica Sinica, 2009, 58(1): 378-383.doi:10.7498/aps.58.378 |
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Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
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Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
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Ma Yan, Zhang Bao-Wu, Zheng Cun-Lan, Ma Shan-Shan, Li Fo-Sheng, Wang Zhan-Shan, Li Tong-Bao.The preliminary result of laser- focused Cr atomic deposition for fabricating nanostructure. Acta Physica Sinica, 2007, 56(3): 1365-1369.doi:10.7498/aps.56.1365 |
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Wang Qing-Xue, Yang Jian-Rong, Wei Yan-Feng.Theoretical research on critical thickness of HgCdTe epitaxial layers. Acta Physica Sinica, 2005, 54(12): 5814-5819.doi:10.7498/aps.54.5814 |
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Zhao Hui, Guo Mei-Fang, Dong Bao-Zhong.Determination of the transition-layer thickness of a crystalline polymer by using small-angle x-ray scattering. Acta Physica Sinica, 2004, 53(4): 1247-1250.doi:10.7498/aps.53.1247 |
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Zhang Jin-Cheng, Hao Yue, Li Pei-Xian, Fan Long, Feng Qian.Thickness measurement of GaN film based on transmission spectra. Acta Physica Sinica, 2004, 53(4): 1243-1246.doi:10.7498/aps.53.1243 |
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LI ZHI-HONG, GONG YAN-JUN, WU DONG, SUN YU-HAN, WANG JUN, LIU YI, DONG BAO-ZHONG.DETERMINATION OF THE AVERAGE THICKNESS OF INTERFACE LAYER WRAPPED ABOUT SiO2 SOLS BY SAXS. Acta Physica Sinica, 2001, 50(6): 1128-1131.doi:10.7498/aps.50.1128 |
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XU KE-WEI, GAO RUN-SHENG, YU LI-GEN, HE JIA-WEN.THIN FILM STRESS EVALUATION BY A GLANCING X-RAY BEAM. Acta Physica Sinica, 1994, 43(8): 1295-1300.doi:10.7498/aps.43.1295 |
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CHENG JIAN-BANG, CHENG WAN-RONG, WANG XI-HONG, HAO GONG-ZHANG, WU ZHANG-CUN.NON-DESTRUCTIVE DETERMINATION OF COMPOSITION AND THICKNESS OF MULTI-COMPONENT ALLOY THIN FILMS BY X-RAY FLUORESCENCE SPECTROSCOPIC METHOD. Acta Physica Sinica, 1983, 32(2): 251-255.doi:10.7498/aps.32.251 |
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CHENG WAN-BONG, GAO QIAO-JUN, WU ZI-QIN.SIMULTANEOUS MEASUREMENT OF THE CONSTITUENT AND THICKNESS OF THIN FILM BY X-RAY EDS. Acta Physica Sinica, 1982, 31(1): 30-37.doi:10.7498/aps.31.30 |