[1] |
Huang Hao, Zhang Kan, Wu Ming, Li Hu, Wang Min-Juan, Zhang Shu-Ming, Chen Jian-Hong, Wen Mao.Comparison between axial residual stresses measured by Raman spectroscopy and X-ray diffraction in SiC fiber reinforced titanium matrix composite. Acta Physica Sinica, 2018, 67(19): 197203.doi:10.7498/aps.67.20181157 |
[2] |
Han Liang, Liu De-Lian, Chen Xian, Zhao Yu-Qing.The effect of the interlayer CrN on adhesion characteristics of ta-C films on high-speed steel substrate. Acta Physica Sinica, 2013, 62(9): 096802.doi:10.7498/aps.62.096802 |
[3] |
Pan Hui-Ping, Cheng Feng-Feng, Li Lin, Horng Ray-Hua, Yao Shu-De.Structrual analyses of Ga2+xO3-x thin films grown on sapphire substrates. Acta Physica Sinica, 2013, 62(4): 048801.doi:10.7498/aps.62.048801 |
[4] |
Li Jia, Fang Qi, Luo Bing-Chi, Zhou Min-Jie, Li Kai, Wu Wei-Dong.Residual stress analysis by grazing-incidence X-ray diffraction on beryllium films. Acta Physica Sinica, 2013, 62(14): 140701.doi:10.7498/aps.62.140701 |
[5] |
Xu Xiao-Ming, Miao Wei, Tao Kun.Direct method of determining the lattice parameters of a phase from X-ray diffraction pattern of multi-phase. Acta Physica Sinica, 2011, 60(8): 086101.doi:10.7498/aps.60.086101 |
[6] |
Tang Jun, Liu Zhong-Liang, Ren Peng, Yao Tao, Yan Wen-Sheng, Xu Peng-Shou, Wei Shi-Qiang.Structural characterization of Mn doped SiC magnetic thin films. Acta Physica Sinica, 2010, 59(7): 4774-4780.doi:10.7498/aps.59.4774 |
[7] |
Li Jiu-Sheng, Li Xiang-Jun.Accurate optical parameter determination of corn oil with terahertz wave time-domain spectroscopy. Acta Physica Sinica, 2009, 58(8): 5805-5809.doi:10.7498/aps.58.5805 |
[8] |
Su Hai-Qiao, Xue Shu-Wen, Chen Meng, Li Zhi-Jie, Yuan Zhao-Lin, Fu Yu-Jun, Zu Xiao-Tao.Effects of Ti ion implantation and post-thermal annealing on the structural and optical properties of ZnS films. Acta Physica Sinica, 2009, 58(10): 7108-7113.doi:10.7498/aps.58.7108 |
[9] |
Li Yong-Hua, Liu Chang-Sheng, Meng Fan-Ling, Wang Yu-Ming, Zheng Wei-Tao.X-ray photoelectron spectroscopy analysis of the effect of thickness on the transformation temperature of NiTi alloy thin films. Acta Physica Sinica, 2009, 58(4): 2742-2745.doi:10.7498/aps.58.2742 |
[10] |
Li Hong-Tao, Luo Yi, Xi Guang-Yi, Wang Lai, Jiang Yang, Zhao Wei, Han Yan-Jun, Hao Zhi-Biao, Sun Chang-Zheng.Thickness measurement of GaN films by X-ray diffraction. Acta Physica Sinica, 2008, 57(11): 7119-7125.doi:10.7498/aps.57.7119 |
[11] |
Liao Nai-Man, Li Wei, Jiang Ya-Dong, Kuang Yue-Jun, Qi Kang-Cheng, Li Shi-Bin, Wu Zhi-Ming.Thickness and optical constant determination of hydrogenated amorphous silicon thin film from transmittance spectra of ellipsometer. Acta Physica Sinica, 2008, 57(3): 1542-1547.doi:10.7498/aps.57.1542 |
[12] |
Niu Rui-Qi, Dong Hui-Ru, Wang Yun-Ping.Preparation and properties of the organic nonlinear optical crystal trans-4-[4-(dimethylamino) styryl]-1-methylpyridium p-toluenesulfonate. Acta Physica Sinica, 2007, 56(7): 4235-4241.doi:10.7498/aps.56.4235 |
[13] |
Xie Zi-Li, Zhang Rong, Xiu Xiang-Qian, Liu Bin, Zhu Shun-Ming, Zhao Hong, Pu Lin, Han Ping, Jiang Ruo-Lian, Shi Yi, Zheng You-Dou.The oxidation characteristics of InN films. Acta Physica Sinica, 2007, 56(2): 1032-1035.doi:10.7498/aps.56.1032 |
[14] |
Lü Hui-Min, Chen Guang-De, Yan Guo-Jun, Ye Hong-Gang.The growth mechanism of monocrystal aluminum nitride nanowires at low temperature. Acta Physica Sinica, 2007, 56(5): 2808-2812.doi:10.7498/aps.56.2808 |
[15] |
Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
[16] |
Feng Qian, Wang Feng-Xiang, Hao Yue.Effect of Mg doping on properties of AlGaN films. Acta Physica Sinica, 2004, 53(10): 3587-3590.doi:10.7498/aps.53.3587 |
[17] |
Cao Xia, Wang Zhi-Guo, He Sai-Ling, Xia Yu-Xing , Zhan Li.Comparative studies on annealed proton exchange waveguides inY-cut MgO:LiNbO.3 and Z-cut LiNbO.3. Acta Physica Sinica, 2004, 53(11): 3786-3793.doi:10.7498/aps.53.3786 |
[18] |
Du Xiao-Song, S. Hak, O. C. Rogojanu, T. Hibma.X-ray study of chromium oxide films epitaxially grown on MgO. Acta Physica Sinica, 2004, 53(10): 3510-3514.doi:10.7498/aps.53.3510 |
[19] |
Shen Hu-Jiang, Wang Lin-Jun, Fang Zhi-Jun, Zhang Ming-Long, Yang Ying, Wang Lin, Xia Yi-Ben.Study on optical properties of diamond films by means of infrared spectroscopic ellipsometry. Acta Physica Sinica, 2004, 53(6): 2009-2013.doi:10.7498/aps.53.2009 |
[20] |
Chen Dun-Jun, Shen Bo, Zhang Kai-Xiao, Deng Yong-Zhen, Fan Jie, Zhang Rong, Shi Yi, Zheng You-Dou.Structural properties of GaN1-xPx films. Acta Physica Sinica, 2003, 52(7): 1788-1791.doi:10.7498/aps.52.1788 |