[1] |
Ju Xiao-Lu, Li Ke, Yu Fu-Cheng, Xu Ming-Wei, Deng Biao, Li Bin, Xiao Ti-Qiao.Move contrast X-ray imaging of electrochemical reaction process in electrolytic cell. Acta Physica Sinica, 2022, 71(14): 144101.doi:10.7498/aps.71.20220339 |
[2] |
Yang Qiang, Liu Xin, Guo Jin-Chuan, Lei Yao-Hu, Huang Jian-Heng, Niu Han-Ben.Experimental study of X-ray phase contrast imaging without absorbing grating. Acta Physica Sinica, 2012, 61(16): 160702.doi:10.7498/aps.61.160702 |
[3] |
Zhang Xiang-Zhi, Xu Zi-Jian, Zhen Xiang-Jun, Wang Yong, Guo Zhi, Yan Rui, Chang Rui, Zhou Ran-Ran, Tai Ren-Zhong.Soft X-ray spectromicroscopy dual-energy contrast image for element spatial distribution analysis. Acta Physica Sinica, 2010, 59(7): 4535-4541.doi:10.7498/aps.59.4535 |
[4] |
Xu Yue-Sheng, Tang Lei, Wang Hai-Yun, Liu Cai-Chi, Hao Jing-Chen.Study on the cell structure in semi-insulation gallium arsenide. Acta Physica Sinica, 2004, 53(2): 651-655.doi:10.7498/aps.53.651 |
[5] |
.A STUDY OF GROWTH SECTOR BOUNDARIES IN NATURAL BERYLS BY X-RAY DIFFRACTION TOPOGRAPHY AND OPTICAL BIREFRINGENCE TOPOGRAPHY. Acta Physica Sinica, 1989, 38(8): 1253-1258.doi:10.7498/aps.38.1253 |
[6] |
.STUDY OF SLIP BY DISLOCATIONS IN GaAs CRYSTAL BY X一RAY TOPOGRAPHY. Acta Physica Sinica, 1989, 38(8): 1344-1347.doi:10.7498/aps.38.1344 |
[7] |
ZHAO QING-LAN, HUANG YI-SEN.X-RAY TOPOGRAPHIC CONTRAST OF INCLUSIONS IN CRYSTAL OF POTASSIUM ACID PHTHALATE. Acta Physica Sinica, 1989, 38(7): 1134-1139.doi:10.7498/aps.38.1134 |
[8] |
YANG YAN-YONG, ZHANG GUANG-YIN, WU BO-CHANG.THE INFRARED REFLECTION SPECTRA OF THE CRYSTALS OF BARIUM MATEBORATE IN THE LOW TEMPRETURE PHASE. Acta Physica Sinica, 1987, 36(3): 395-400.doi:10.7498/aps.36.395 |
[9] |
CHU XI, MAI ZHEN-HONG, DAI DAO-YANG, CUI SHU-FAN, GE PEI-WEN.STUDY ON A PLANE-LIKE PRECIPITATE IN SILICON SINGLE CRYSTAL BY X-RAY TOPOGRAPHIC METHOD. Acta Physica Sinica, 1987, 36(3): 408-410.doi:10.7498/aps.36.408 |
[10] |
GE CHUAN-ZHENG, JIANG SHU-SHENG, MING NAI-BEN, FENG DUAN.A STUDY OF INCLUSIONS AND DISLOCATIONS IN LiNbO3 CRYSTALS BY X-RAY TOPOGRAPHY. Acta Physica Sinica, 1987, 36(4): 490-494.doi:10.7498/aps.36.490 |
[11] |
JIANG BAI-LIN, LIU XI-LIN, XU BIN, LU BAO-SHENG.X-RAY TOPOGRAPHY STUDY OF THE FERROELASTIC DOMAIN WALLS IN NdP5O14 CRYSTALS. Acta Physica Sinica, 1986, 35(12): 1598-1602.doi:10.7498/aps.35.1598 |
[12] |
JIANG BAI-LIN, XU BIN, LIU XI-LIN, HAN JIAN-RU.X-RAY DIFFRACTION TOPOGRAPHY STUDY OF DEFECTS IN AlPO4 CRYSTALS. Acta Physica Sinica, 1985, 34(9): 1229-1232.doi:10.7498/aps.34.1229 |
[13] |
SHI ZI-KANG, JIANG AI-DONG, YE HAI-TAO, CHEN CHUANG-TIAN.ELECTRICAL PROPERTIES OF A NEW PYROELECTRIC BARIUM METABORATE CRYSTAL IN LOW TEMPERA-TURE PHASES AND ITS POTENTIAL APPLICA-TION IN INFRARED PYROELECTRIC DETECTOR. Acta Physica Sinica, 1985, 34(1): 140-144.doi:10.7498/aps.34.140 |
[14] |
LI RU-KANG, CHEN CHUANG-TIAN.THE THEORETICAL CALCULATION OF SHG COEFFICIENTS OF β-BaB2O4 CRYSTAL. Acta Physica Sinica, 1985, 34(6): 823-827.doi:10.7498/aps.34.823 |
[15] |
JIANG SHU-SHENG.FADING PHENOMENON OF PENDELLOSUNG FRINGES IN X-RAY SECTION TOPOGRAPHY. Acta Physica Sinica, 1983, 32(12): 1497-1504.doi:10.7498/aps.32.1497 |
[16] |
LU SHAO-FANG, HE MEI-YUN, HUANG JIN-LING.CRYSTAL STRUCTURE OF THE LOW TEMPERATURE FORM OF BARIUM BARATE Ba3(B3O6)2. Acta Physica Sinica, 1982, 31(7): 948-955.doi:10.7498/aps.31.948 |
[17] |
MAI ZHEN-HONG, GE PEI-WEN, CU I SHU-FAN, XIAO NAN, WU LAN-SHENG.THE OBSERVATION ON DEFECTS IN YAG SINGLE CRYSTAL BY X-RAY TRANSMISSION TOPOGRAPHY. Acta Physica Sinica, 1981, 30(7): 999-1002.doi:10.7498/aps.30.999 |
[18] |
MAI ZHEN-HONG, GE PEI-WEN, CUI SHU-FAN, WU LAN-SHENG.THE OBSERVATION OF DEFECTS IN SYNTHETIC QUARTZ BY X-RAY TOPOGRAPHY. Acta Physica Sinica, 1981, 30(8): 1106-1110.doi:10.7498/aps.30.1106 |
[19] |
ZHOU HENG-NAN, JIANG SHU-SHENG.X-RAY DIFFRACTION TOPOGRAPHIC STUDY OF CRYSTAL DEFECT IN LiNbO3. Acta Physica Sinica, 1980, 29(3): 374-379.doi:10.7498/aps.29.374 |
[20] |
GU YUAN-XIN, GE PEI-WEN, ZHAO YA-QIN, HU BO-QING, WU LAN-SHENG, FU QUAN-GUI.X-RAY TOPOGRAPHICAL STUDY ON DEFECTS IN α-LiIO3DECORATED BY SPACE CHARGE DUE TO THE APPLIED DC FIELDS. Acta Physica Sinica, 1980, 29(6): 711-717.doi:10.7498/aps.29.711 |