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Wang Zi-Yao, Chen Fu-Jia, Xi Xiang, Gao Zhen, Yang Yi-Hao.Non-reciprocal topological photonics. Acta Physica Sinica, 2024, 73(6): 064201.doi:10.7498/aps.73.20231850 |
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Guan Xin, Chen Gang.Topological nonmediocre nodes on two-leg superconducting quantum circuits. Acta Physica Sinica, 2023, 72(14): 140301.doi:10.7498/aps.72.20230152 |
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Pei Dong-Liang, Yang Tao, Chen Meng, Liu Yu, Xu Wen-Shuai, Zhang Man-Gong, Jiang Heng, Wang Yu-Ren.Broadband periodic and aperiodic acoustic topological insulator based on composite honeycomb structure. Acta Physica Sinica, 2020, 69(2): 024302.doi:10.7498/aps.69.20191454 |
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Wu Feng, Guo Zhi-Wei, Wu Jia-Ju, Jiang Hai-Tao, Du Gui-Qiang.Band gap engineering and applications in compound periodic structure containing hyperbolic metamaterials. Acta Physica Sinica, 2020, 69(15): 154205.doi:10.7498/aps.69.20200084 |
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Deng Tian-Shu, Yi Wei.Fixed points and dynamic topological phenomena in quench dynamics. Acta Physica Sinica, 2019, 68(4): 040303.doi:10.7498/aps.68.20181928 |
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Wang Xin-Yang, Chen Nian-Ke, Wang Xue-Peng, Zhang Bin, Chen Zhi-Hong, Li Xian-Bin, Liu Xian-Qiang.Bonding nature of the amorphous structure studied by a combination of cutoff and electronic localization function. Acta Physica Sinica, 2016, 65(17): 173101.doi:10.7498/aps.65.173101 |
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Zhou Yang, Guo Jian-Hong.Shot noise characteristics of Majorana fermions in transport through double quantum dots. Acta Physica Sinica, 2015, 64(16): 167302.doi:10.7498/aps.64.167302 |
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Ren Jian, Yan Da-Wei, Gu Xiao-Feng.Degradation mechanism of leakage current in AlGaN/GaN high electron mobility transistors. Acta Physica Sinica, 2013, 62(15): 157202.doi:10.7498/aps.62.157202 |
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Shang Huai-Chao, Liu Hong-Xia, Zhuo Qing-Qing.Degradation mechanism of SOI NMOS devices exposed to 60Co γ-ray at low dose rate. Acta Physica Sinica, 2012, 61(24): 246101.doi:10.7498/aps.61.246101 |
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Yu Zong-Guang, Xiao Zhi-Qiang, Zhou Xin-Jie, Li Lei-Lei.Threshold voltage degradation mechanism of SOI SONOS EEPROM under total-dose irradiation. Acta Physica Sinica, 2011, 60(9): 098502.doi:10.7498/aps.60.098502 |
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Xiao Yi, Guo Qi, Yang Xiang-Bo, Lan Sheng.The propagation properties of symmetrical hyperbolic secant beams in weakly nonlocal nonlinear bulk media. Acta Physica Sinica, 2008, 57(6): 3553-3561.doi:10.7498/aps.57.3553 |
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Sheng Li-Yuan, Jia Wei-Yao, Wu Shu-Ci, Xia Guo-Rong.The intermittency and extended dimension induced by truncation error. Acta Physica Sinica, 2007, 56(7): 3753-3758.doi:10.7498/aps.56.3753 |
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Li Zhong-He, Liu Hong-Xia, Hao Yue.Mechanism of NBTI degradation in ultra deep submicron PMOSFET’s. Acta Physica Sinica, 2006, 55(2): 820-824.doi:10.7498/aps.55.820 |
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Liu Hong Xia, Zheng Xue Feng, Hao Yue.Degradation and physical mechanism of NBT in deep submicron PMOSFET's. Acta Physica Sinica, 2005, 54(3): 1373-1377.doi:10.7498/aps.54.1373 |
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Sheng Li-Yuan, Jia Wei-Yao.A stochastic digital oscillating system induced by the truncation error. Acta Physica Sinica, 2005, 54(12): 5574-5580.doi:10.7498/aps.54.5574 |
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WANG LI-MIN, LUO YING, MA BEN-KUN.ELECTRONIC STRUCTURE OF DOUBLE QUANTUM-DOT MOLECULE. Acta Physica Sinica, 2001, 50(2): 278-286.doi:10.7498/aps.50.278 |
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REN HONG-XIA, HAO YUE.STUDY ON THE HOT-CARRIER-DEGRADATION MECHANISM AND HOT-CARRIER-EFFECT IMMUNITY I N ADVANCED GROOVED-GATE PMOSFET. Acta Physica Sinica, 2000, 49(9): 1683-1688.doi:10.7498/aps.49.1683 |
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