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Xiao Di, Wang Dong-Ming, Li Xun, Li Qiang, Shen Kai, Wang De-Zhao, Wu Ling-Ling, Wang De-Liang.Nickel oxide as back surface field buffer layer in CdTe thin film solar cell. Acta Physica Sinica, 2017, 66(11): 117301.doi:10.7498/aps.66.117301 |
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Ding Zhao, Wei Jun, Yang Zai-Rong, Luo Zi-Jiang, He Ye-Quan, Zhou Xun, He Hao, Deng Chao-Yong.Study on temperature calibration and surface phase transition of GaAs crystal substrate in MBE growth by RHEED real-time monitoring. Acta Physica Sinica, 2011, 60(1): 016109.doi:10.7498/aps.60.016109 |
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Sheng Yi, Tian Hong, Xu Yao, Lü Chun-Xiang, Wu Zhong-Hua, Zhang Cai-Hong.The evolution of crystalline structure in the preparationof PAN-based carbon fibers studiedby whole powder pattern fitting. Acta Physica Sinica, 2011, 60(3): 036101.doi:10.7498/aps.60.036101 |
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Zheng Xu, Li Bing, Wang Zhao, Zhang Dong-Ting, Feng Liang-Huan, Zhang Jing-Quan, Cai Ya-Ping, Zheng Jia-Gui, Wu Li-Li, Li Wei, Lei Zhi, Zeng Guang-Gen.Cu deep level center in CdTe solar cell. Acta Physica Sinica, 2010, 59(4): 2783-2788.doi:10.7498/aps.59.2783 |
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Zhang Chong, Ye Hui, Zhang Lei, Huang-Fu You-Rui, Liu Xu.A study of RHEED pattern from the epitaxial growth of Si-Ge crystal. Acta Physica Sinica, 2009, 58(11): 7765-7772.doi:10.7498/aps.58.7765 |
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Niu Hua-Lei, Li Xiao-Na, Hu Bing, Dong Chuang, Jiang Xin.Room-temperature photoluminescence analysis of nano-β-FeSi2/a-Si multilayer films. Acta Physica Sinica, 2009, 58(6): 4117-4122.doi:10.7498/aps.58.4117 |
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Ren Rong, Wu Yu-Cheng, Tang Wen-Ming, Wang Feng-Tao, Zheng Zhi-Xiang.Structural evolution and grain growth kinetics of the mechanically alloyed Fe42.5Al42.5Ti5B10 induced by annealing. Acta Physica Sinica, 2008, 57(9): 5774-5781.doi:10.7498/aps.57.5774 |
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Ren Peng, Liu Zhong-Liang, Ye Jian, Jiang Yong, Liu Jin-Feng, Sun Yu, Xu Peng-Shou, Sun Zhi-Hu, Pan Zhi-Yun, Yan Wen-Sheng, Wei Shi-Qiang.Structural study of MnxSi1-x magnetic semiconductor thin films. Acta Physica Sinica, 2008, 57(7): 4322-4327.doi:10.7498/aps.57.4322 |
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Yan Feng-Ping, Zheng Kai, Wang Lin, Li Yi-Fan, Gong Tao-Rong, Jian Shui-Sheng, K. Ogata, K. Koike, S. Sasa, M. Inoue, M. Yano.Measurement of thickness and refractive index of Zn1-xMgxO film grown on sapphire substrate by molecular beam epitaxy. Acta Physica Sinica, 2007, 56(7): 4127-4131.doi:10.7498/aps.56.4127 |
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Sun Yu, Sun Zhi-Hu, Zhu San-Yuan, Shi Tong-Fei, Ye Jian, Pan Zhi-Yun, Liu Wen-Han, Wei Shi-Qiang.Structure of MnxGe1－x dilute magnetic semiconductor films. Acta Physica Sinica, 2007, 56(9): 5471-5475.doi:10.7498/aps.56.5471 |
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Qin Pei, Lou Yu-Wan, Yang Chuan-Zheng, Xia Bao-Jia.New computing methods and programs for separating multipe-broadening effects of X-ray diffraction lines. Acta Physica Sinica, 2006, 55(3): 1325-1335.doi:10.7498/aps.55.1325 |
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Wang Chong, Chen Ping-Ping, Liu Zhao-Lin, Li Tian-Xin, Xia Chang-Sheng, Chen Xiao-Shuang, Lu Wei.Study of the modulated spectra of dilute GaNxAs1－x (x≤0.03) thin films. Acta Physica Sinica, 2006, 55(7): 3636-3641.doi:10.7498/aps.55.3636 |
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Yan Feng-Ping, Jian Shui-Sheng, Ogata K., Koike K., Sasa S., Inoue M., Yano M..Measurement of Mg content in Zn1－xMgxO films by inductively coupled plasma method. Acta Physica Sinica, 2006, 55(6): 3013-3017.doi:10.7498/aps.55.3013 |
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Wei Xian-Hua, Zhang Ying, Li Jin-Long, Deng Xin-Wu, Liu Xing-Zhao, Jiang Shu-Wen, Zhu Jun, Li Yan-Rong.Analysis of reflection high-energy electron diffraction pattern during SrTiO3 homoepitaxy. Acta Physica Sinica, 2005, 54(1): 217-220.doi:10.7498/aps.54.217 |
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Liu Ying, Ge Pei-Wen, Su Shao-Kui, Zhang Li-Juan, Wang Yun-Ping.Thermal analysis and structure transformation of Mn12-Ac magnetic molecular crystals. Acta Physica Sinica, 2004, 53(11): 4015-4020.doi:10.7498/aps.53.4015 |
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Fan Jiang-Wei, Bian Qing, Yin Shi-Long, Yan Wen-Sheng, Liu Wen-Han, Wei Shi-Qiang.X-ray absorption fine structure and x-ray diffraction studies on structures of Fe70Cu30 alloys affected by mechanical alloying. Acta Physica Sinica, 2004, 53(2): 514-520.doi:10.7498/aps.53.514 |
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Chen Ying-Fei, Peng Wei, Li Jie, Chen Ke, Zhu Xiao-Hong, Wang Ping, Zeng Guang, Zheng Dong-Ning, Li Lin.In-situ monitoring of the growth of oxide thin films in PLD using high-pressure reflection high energy electron diffraction. Acta Physica Sinica, 2003, 52(10): 2601-2606.doi:10.7498/aps.52.2601 |
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LI QI, PAN HAI-BIN, ZHU CHUAN-GANG, XU PENG-SHOU, ZHOU YANG-XUE, ZHANG XIN-YI.XRD AND XPS STUDIES OF Bi2Sr2CaCu2-xSnxO8+δ SYSTEM. Acta Physica Sinica, 2000, 49(10): 2055-2058.doi:10.7498/aps.49.2055 |
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CHEN KE-MING, JIN GAO-LONG, SHENG CHI, ZHOU GUO-LIANG, JIANG WEI-DONG, ZHANG XIANG-JIU, YU MING-REN.PHASE-LOCKED EPITAXY OF Ge/Si SUPERLATTICES BY USING RHEED INTENSITY OSCILLATIONS. Acta Physica Sinica, 1990, 39(3): 408-415.doi:10.7498/aps.39.408 |
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JIN GAO-LONG, CHEN KE-MING, SHENG CHI, ZHOU GUO-LIANG, JIANG WEI-DONG, ZHANG XIANG-JIU.OBSERVATION OF INTENSITY OSCILLATIONS OF RHEED DURING SILICON MOLECULAR BEAM EPITAXIAL GROWTH. Acta Physica Sinica, 1989, 38(3): 394-398.doi:10.7498/aps.38.394 |
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